Comparative analysis of digital televisions; reliability of spare parts; configurability and security.
Arms Ajay Joshi investigates how to select the right benchmark for processors used in the home appliance market, such as digital TV and set-top boxes/over-the-top devices.
Ansys’ Jon Kordell verifies how physical reliability simulations and physical component characterization can support component interchange in high-reliability applications when the original part is unavailable due to supply chain shortages.
Siemens Jake Wiltgen and Chuck Battikha Consider how adding configurability to an IP or IC can lead to significant challenges and overhead when delivering a security scan and an ISO 26262 compliant product.
Cadences Paul McLellan examines how governments around the world are trying to encourage stronger semiconductor manufacturing industries at home.
Synopsis’ Varun Agrawal Check out Source-Based Tone Mapping, a new feature in HDMI 2.1a that enables better display of different types of content such as SDR, HDR, Dynamic HDR and graphics when displayed together on the same screen.
SEMI Michelle Williams Vaden explains why it is important for microelectronics companies to focus on retaining skilled and competent employees, including being mindful of employee well-being.
In a video, VLSI Research Dan Hutcheson talks to Micron’s Scott DeBoer about what it takes to innovate in the memory market today.
And don’t miss the blogs featured in recent Automotive, Security, & Pervasive Computing and Test, Measurement & Analytics newsletters:
Guillaume Boillet of Arteris IP looks at planning and the trade-offs between software and hardware.
Rambus’ Bart Stevens shows how resisting side-channel attacks starts with a proper security threat assessment.
Anders Nordstrom of Tortuga Logic recommends translating hardware CWEs into safety rules for regression runs.
Cadence’s Paul McLellan presents some big ideas that could shape the next decade of the internet.
Infineon’s Jaeeul Yeon explains how to ensure that an enclosure’s isolation characteristics are sufficient for harsh environmental conditions.
AMD’s Ed Rebello takes a look at optimizing servers for today’s task demands.
Synopsys’ Omar Cruz focuses on preventing malicious attacks while mitigating systematic and random errors.
Onto’s Wesley Chou stresses the need to identify open defects earlier in the manufacturing process to limit the impact on yield.
Synopsys’ Rahul Singhal and Giri Podichetty illustrate the testing requirements of AI chips that integrate multiple dies and memories on the same package.
Aileen Ryan of Siemens EDA shows how in-depth monitoring of silicon devices in the field helps improve reliability, safety and security.
Uzi Baruch of proteanTecs advocates for using data to manage data center infrastructure.
Jesse Allen is a Knowledge Center Administrator and Editor at Semiconductor Engineering.